Efficient test compaction for combinational circuits based on Fault detection count-directed clustering
نویسندگان
چکیده
منابع مشابه
Efficient test compaction for combinational circuits based on Fault detection count-directed clustering
Test compaction is an effective technique for reducing test data volume and test application time. In this paper, we present a new static test compaction algorithm based on test vector decomposition and clustering. Test vectors are decomposed and clustered in an increasing order of faults detection count. This clustering order gives more degree of freedom and results in better compaction. Exper...
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Testing system-on-chip involves applying huge amounts of test data, which is stored in the tester memory and then transferred to the circuit under test during test application. Therefore, practical techniques, such as test compression and compaction, are required to reduce the amount of test data in order to reduce both the total testing time and the memory requirements for the tester. In this ...
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ژورنال
عنوان ژورنال: IET Computers & Digital Techniques
سال: 2007
ISSN: 1751-8601
DOI: 10.1049/iet-cdt:20070004